SGS selects Keysight for LTE conformance, device-acceptance test

March 2, 2015

Keysight Technologies has announced that SGS, the global inspection, verification, testing, and certification company, has selected the Keysight T4010S LTE RF conformance test platform for use in its San Diego, CA, test lab. SGS will use the platform to perform certification services in the wireless communications industry. SGS also uses Keysight’s LTE platforms in its Asia labs, including radio resource management (RRM) and protocol, for user-equipment (UE) certification and for cooperative platform validation with Keysight.

“The Keysight T4010S test system helps us minimize testing time for our customers,” said Michael Spitzer, U.S. wireless director of SGS. “The system can easily handle multiple test suites—from conformance testing to verifying network operator requirements. At SGS, improving customer efficiency is essential to our business.”

“We are delighted that SGS has the trust and confidence in our test platforms to make the T4010S the platform of choice for their global operations,” said Joe Depond, Keysight’s Mobile Broadband Division general manager. “We share a common goal of exceeding our customers’ expectations. By understanding the needs of SGS, as well as its customers, we are able to provide the products and services needed to meet the rapidly evolving requirements of the wireless industry.”

The Keysight T4010S covers conformance testing for FDD and TDD, as well as LTE device acceptance test plans as used by several U.S. network operators. LTE Advanced features, such as Release 10 Carrier Aggregation, are also available on the T4010S.

Engineers can use the T4010S test platform for R&D design verification (DV) with the same hardware as used in the conformance testing version. The T4010S DV software mode has the ability to execute test cases with different parameters other than those required by 3GPP. The platform also allows testing for all LTE frequency bands at no additional cost.

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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