Keysight to demonstrate design, test tools at EMC&SI 2015

March 11, 2015

Keysight Technologies announced it will demonstrate and discuss the latest tools and techniques on EMC design and testing and signal and power integrity at the 2015 IEEE Symposium on Electromagnetic Compatibility & Signal Integrity (EMC&SI 2015) in Santa Clara March 17-19.

Keysight will have EMC and signal integrity experts on hand to address the following topics:

  • the latest compliance and diagnostic measurement capabilities of the N9038A MXE EMI receiver;
  • what precompliance measurements and diagnostic evaluation tools are available for the N6141A EMI measurement application for X-Series signal analyzers;
  • how the EMPro 2015 3D EM simulation software can simulate emissions levels versus frequency, and how to compare to common FCC, CISPR, and other EMI emissions standards;
  • how the PLTS 2015 supports the flexible PXIe chassis form factor with VNA modules for multi-channel analysis of high-speed digital interconnect;
  • how PDN component characterization is addressed with the ENA Network Analyzer using the impedance measurement function; and
  • how to easily monitor signal and test components with RF/microwave handheld network and spectrum analyzers.

Keysight offers EMC precomliance and full compliance solutions for conducted and radiated emissions testing for commercial and MIL standards and design. Its solutions are used by engineers who need to understand the conducted and radiated emissions performance of the device they are designing.

www.keysight.com

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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