Cobham AvComm introduces 8800S digital radio test set

March 18, 2015

Las Vegas (International Wireless Communications Expo 2015). Cobham AvComm, formerly the Aeroflex AvComm business unit, announced today the introduction of the new 8800S digital radio test set. Combining high performance and portability, the 8800S features new P25 Phase II test capabilities and 125-W direct power handling.

Designed for bench and field test environments, the 8800S is equipped with a large color display and wide power-measurement range featuring RF signal analysis from -140 dBm to 500 W. Additionally, the new radio test set offers advanced analog and digital analysis features. The 8800S also provides easy-to-use Auto-Test and Alignment applications. Field test technicians and engineers will benefit from the 8800S test set’s compact size, 2.5-hour internal battery operation (usable up to 4 hours), and 30 g functional shock rating (rated to MIL-PRF-28800F Class 3 operation).

Improving upon the popular 8800 platform, the new 8800S now supports direct input power termination up to 125 W, eliminating the need for external attenuators and boosting confidence when testing high-power transmitters. Featuring VSWR, return-loss and distance-to-fault measurements, the 8800S is a comprehensive test system for both bench and field applications.

“The 8800S offers test professionals an unprecedented one-product solution. Without compromising on portability and ruggedness, the test set offers performance and features to meet both bench and field-level applications,” said Rob Barden, director of product marketing for radio test systems at Cobham AvComm. “With the addition of P25 Phase II test capabilities and higher input power measurement capabilities, RF professionals will experience something entirely new in radio and RF distribution system tests.”

The 8800S digital radio test set is available now with a delivery time of six weeks. For more information about pricing, contact your local Cobham AvComm sales office by emailing [email protected].

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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