MVG debuts WaveStudio software for OTA test

April 10, 2015

MVG (Microwave Vision Group) has introduced MVG WaveStudio for OTA testing, data management, and analysis. The new software supersedes MVG’s SAM OTA measurement platform, with has evolved over the last 10 years to address changing standards.

MVG WaveStudio’s automated features make it user-, time-, and cost-friendly. Through its automated test methodology, MVG WaveStudio takes full control of all equipment in an OTA test system once a testing session is underway. It allows engineers to program tests to run in batches or to repeat tests in a single step.

MVG WaveStudio is packaged as a three-part software suite. A free preprocessing module allows users to prepare batches of tests prior to a measurement session. This can be done on any workstation/PC, enabling the measurement-dedicated (control) PC to focus on tests.

Then, licensed software allows for the comprehensive data acquisition of automated OTA measurements. It also comprises post-processing capabilities and enables the generation of reports per the requirements set forth by the standard bodies, such as CTIA and 3GPP.

The third part of the software is a free viewer, which provides access to the measurement results via any PC. Results are easily recalled with practical filters, and measurement plots are viewable in parallel windows for immediate comparisons.

The three parts can be used at different times and on different PCs. MVG WaveStudio is designed to comply with CTIA/3GPP’s OTA requirements. It delivers improved measurement capability and facilitates and shortens the time to complete the testing required for CTIA/3GPP certification.

With MVG multiprobe technology and WaveStudio OTA automation software, approved and certifiable by CTIA/3GPP, tests can be performed quickly and effectively, optimizing test lab operations, increasing test throughput, and ultimately gaining overall time to market of mobile devices.

www.satimo.com/content/products/ota-measurement-suite

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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