Pasternack offers threshold detectors for analyzing radar

Irvine, CA. Pasternack has introduced a new line of coaxial threshold detectors designed for microwave and millimeter wave applications from 2 to 40 GHz. These threshold detectors are commonly used for analyzing radar performance, leveling pulsed signal sources, AM noise measurements, system monitoring, and pulsed RF measurements in ultrabroadband applications.

Pasternack’s latest release of threshold detectors consists of three unique models covering broadband frequency bands from 2 to 40 GHz. Designs incorporate gain stages for higher dynamic range that cover input power levels ranging from -45 dBm to 0 dBm with a typical threshold variation over frequency of ±0.5 dB. One model supports a fixed threshold while the other two models support an adjustable threshold setting. All models feature a TTL-compatible video output response that is “1” when the RF signal is above the threshold setting and “0” when it’s below the threshold setting.

Additional features of the new threshold detectors include rugged construction utilizing compact packages with field-replaceable SMA or 2.92-mm connectors. These models are designed to meet MIL-STD-202F environmental conditions for temperature cycle, humidity, shock, vibration, and altitude. The threshold detectors also boast fast response times ranging from 45 to 100 ns and maximum input power handling ranging from +10 to +17 dBm; they have an operating temperature range of -55 to +85°C.

“These adjustable threshold detectors have the features and broadband performance that are particularly useful for designers who need to analyze critical signal response characteristics,” explained Tim Galla, active components product manager at Pasternack.

http://www.pasternack.com/pages/RF-Microwave-and-Millimeter-Wave-Products/threshold-detectors.html

About the Author

Rick Nelson

Rick Nelson

Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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