inTEST supports temperature cycling with Keysight power device analyzer

Sept. 24, 2015

Mansfield, MA. inTEST Thermal Solutions and Keysight Technologies have announced the integration of rapid temperature cycling with the Keysight B1506A power device analyzer. The Temptronic ThermoStream temperature forcing system from inTEST automates temperature cycling of power devices by interfacing with a specially designed enclosure from Keysight.

Programmable control of ThermoStream systems permits a wide range of temperatures, from -100 to +300°C. With fast thermal cycling rates, the ThermoStream promotes rapid circuit design of power devices such as IGBTs and MOSFETs.

Programmable hot and cold thermal cycling adds to the previously announced capability where power devices are in contact with an inTEST Thermal hotplate integrated in the analyzer’s test fixture.

The B1506A is a single-box solution that automatically characterizes all power device parameters across a wide range of operating conditions and temperatures (-50°C to +250°C), at up to 1,500 A and 3 kV. It measures and evaluates all kinds of parameters, including IV parameters (for example, breakdown voltage and on-resistance), three terminal capacitances with high-voltage bias, gate charge, switching time, and power losses.

http://intestthermal.com/keysight-analyzer-thermal-test-system

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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