Autotestcon panels to address MIL/aero test issues

Sept. 28, 2015

Autotestcon will convene November 2 in National Harbor, MD. The event will include three panel sessions on Wednesday November 4, addressing topics including Army ATS weapons system support, modular instrumentation, and design for testability.

First up is “Army Consolidation of ATS Enhances Weapon System Support Effectiveness,” scheduled from 10:30 a.m. to 12:30 p.m. The panel will be moderated by George Mitchell, Product Director Test, Measurement, and Diagnostic Equipment (PD TMDE), which is responsible for the lifecycle management of the Army’s Calibration Sets (CALSETS); General Purpose Electronic Test Equipment (GPETE); the Test Equipment Modernization (TEMOD) program; and, the Integrated Family of Test Equipment (IFTE), comprising At-Platform Automatic Test Systems (APATS) and Off-Platform Automatic Test Systems (OPATS).

Participants include Mike Haynes (CASCOM), Army User Community, and Jay Romania, Army Technical Community Army G4 Representative, Depot Community Representative. The panel will discuss the Army’s use of Next Generation Automatic Test Systems (NGATS) to consolidate weapon system support.

Next is “2015 Outlook of Modular Instrumentation in the T&M Industry,” scheduled from 1:30 pm to 3:30 pm and moderated by Bob Helsel, executive director of the VXIbus Consortium, PXI Systems Alliance, LXI Consortium, and AXIe Consortium.

Panelists will include Reggie Rector of National Instruments, co-chair of the PXISA marketing committee; Tom Sarfi, president, VXIbus Consortium, and VP marketing and business development at VTI Instruments Corp.; Larry Desjardin, president, Modular Methods, and former chairman of the board of the AXIe Consortium; Von Campbell, chairman of the board, AXIe Consortium, and platform components R&D manager at Keysight Technologies; and Steve Schink, also from Keysight and president of the LXI Consortium.

The panelists will discuss the status and outlook for VXI, PXI, LXI, and AXIe instrumentation and investigate whether modular instrumentation has become the de facto standard for automated test in MIL/aero applications.

The final panel of the day is “Design for Testability,” scheduled from 3:30 p.m. to 5:30 p.m. Louis Y. Ungar, Advanced Test Engineering (A.T.E.), will serve as moderator.

Panelists will include Loofie Gutterman, president of Marvin Test Solutions; Dr. David R. Carey, Associate Professor of Electrical Engineering, Wilkes University; Craig Stoldt, test engineering manager, BAE Systems; Dr. Russell Shannon, IDATS lead systems engineer, NAVAIR, US Navy, Lakehurst, NJ; Bill Eklow, test engineering manager, Cisco Systems; and Mike Ellis, retired, previously with Northrop Grumman Corp., ATE Associates, and Harris Corp. and also serving as the Autotestcon 2015 technical program cochairman.

The panelists will touch on DFT techniques, such as JTAG/IEEE-1149.1 boundary scan, that have assisted in board manufacturing test, and they will investigate why system-level applications have been lagging. They will also address new techniques, such as ones based on IEEE-1687, and the role of management in backing the design testable systems.

Read more on the panels here.

Visit our Autotestcon page for updates.

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

Sponsored Recommendations

Comments

To join the conversation, and become an exclusive member of Electronic Design, create an account today!