VTI Instruments has announced that it will be exhibiting at the Automotive Testing Expo October 20-22 in Novi, MI, where it will be showing solutions for ECU modular test as well as rugged data-acquisition systems.
On display will be modular/portable data acquisition solutions, including a handheld 4-slot PXI Express tablet, a 625-kSa/s/channel data-acquisition capability and 204-kSa/s source, and powerful yet intuitive X-Modal III Modal Analysis software, which supports multiple live parameter estimation windows.
Also on display will be modular ECU test subsystems, including 100-V solid-state switching product and 500-kSa/s, high-voltage AWG. The company offers the ability to switch up to 1,500 test points to test instrumentation in < 1 ms per channel and to simulate ECU signals and transients up to 500 kSa/s/channel, to 160 V pk. Switching options to 16 A and 1000 V are available.
Finally, the company with highlight ruggedized, precision temperature measurement capability, supporting 32 channels at high accuracy. Measurements to < 0.2°C can be made in harsh test-cell environments, with IP65 rating and the ability to operate from -40 to +71°C.
About the Author
Rick Nelson
Contributing Editor
Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.