Autotestcon convenes this week in National Harbor, MD, near Washington, DC. Monday will see a full day of tutorials. The technical program, panel sessions, and exhibits commence on Tuesday, with John Johns, Deputy Assistant Secretary of Defense, delivering a keynote address Tuesday morning. Dr. James Truchard, president and CEO of National Instruments, will deliver a keynote Wednesday morning.
In the run-up to the show, several vendors, including ADLINK Technology, Marvin Test Solutions, and JTAG Technologies, have commented on the products they plan to exhibit.
For example, ADLINK announced it will exhibit its latest PXI Express and USB-based test systems, including a data-streaming test system, micro-electro-mechanical systems (MEMS) microphone test system, power-supply test demo kits, and a dynamic rotor balance analysis system. (For more, click here.)
Marvin Test Solutions said it will feature the GX7016 GENASYS switching subsystem, GX5296 digital subsystem, MTS-3060 SmartCan universal O-level test set for 4th and 5th generation fighter aircraft, the MTS-200 Series field test sets, and ATEasy test executive and development software. (For more, click here.)
In addition, JTAG Technologies said it will be on hand to describe how to upgrade ICT, MDA, or flying-probe systems with the company’s boundary-scan solutions. The company will also emphasize how access to an assembly under test via oundary-scan pins can simplify test programs and ease diagnosis in case of faults.
Peter van den Eijnden, managing director of JTAG Technologies, commented this year’s focus for the show, saying, “…we are cooperating with renowned ATE suppliers to make sure that our customers will continue to enjoy optimal use of their existing ICT/MDA/FPT/FCT systems throughout the coming years. In joint efforts with various test-system manufacturers we developed special hardware and software solutions. These special solutions enable perfect integration of our tools into these test systems, so users benefit from advantages of the combination of both methods.”
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