RF contact probe is designed for high-speed data connectors

Dec. 1, 2015

The new P819 from Peak Test Services is a spring-contact probe specifically designed for contacting HSD (high-speed data) connectors in RF applications.

The probe is equipped with a calyx spring for optimized guiding of the probe onto the connector. The conical insertion configuration of the circular contact and the position of the calyx spring provide an optimum set-up for maximizing the capture area and minimizing damage to the probe or the connector.

The P819 probe is available in different versions with different tip styles of the inner pins. For easy and secure connection of the probe, different contact elements are available to allow well defined and reproducible measuring paths even when probes are changed.

Currently the P819 allows testing with signals up to 2 GHz. However a further probe for signals up to 3 GHz with a self-cleaning tip style is planned for future release.

The new probes are available in the UK and Ireland from Peak Test Services and via a range of appointed distributors worldwide.

http://www.peaktest.co.uk

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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