Anritsu and DVT demonstrate signal-integrity test at DesignCon

Jan. 21, 2016

Santa Clara, CA. Anritsu and DVT Solutions are demonstrating an integrated test solution that can conduct high-quality S-parameter measurements as well as time domain analysis on high-speed printed circuit boards (PCBs), packages, and backplanes at DesignCon 2016 this week. The configuration featuring the Anritsu VectorStar vector network analyzer (VNA) and the DVT PCB probing solution addresses the market need to accurately and efficiently perform signal-integrity tests on products used in emerging communications systems.

The solution combines the GigaProbe DVT70A differential, 50-Ω variable-pitch probe tip from DVT with the Anritsu MS4640B 4-port VectorStar VNA. Due to the overall performance of VectorStar, the system being shown at DesignCon has exceptional calibration and measurement stability, wide frequency range of 70 kHz to 70 GHz, best-in-class power range and control, and optimum on-wafer installation.

“The integration of the DVT probe system with our VectorStar VNA at DesignCon allows us to showcase the S-parameter data as well time domain analysis necessary to verify today’s PC boards, packages and backplanes. The high-quality, and low- and high-frequency performance of VectorStar can now be realized up to 70 GHz in a differential probing solution,” said Paul Innis, vice president and general manager of Anritsu.

“Design engineers that need to verify performance based on the latest high-speed standards require test solutions that deliver reliable and accurate results. Our DVT probe system allows the full capability of VectorStar to be achieved, so engineers have greater confidence in their designs,” said Brian Shumaker, president, DVT Solutions, LLC.

Also at DesignCon, Anritsu is demonstrating a 56G NRZ and PAM4 accurate jitter tolerance test system with the MP1800A BERT and MP1825B 4-tap emphasis instrument; a high-speed serial bus test solution for jitter tolerance tests on PCIe and 100GE interfaces; a 40/100G active time domain (ATD) test of AOC (active optical cable) and Q-SFP (quad small form factor pluggable) transceiver; a 4-port 70-kHz to 110-GHz broadband VNA, and a 43.5-GHz 4-port VNA integrated with the Wild River Technology CMP-28/CMP-32 channel modeling platform to conduct differential S-parameter measurements.

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.