Richardson, TX. Anritsu has introduced a series of options for its Network Master Pro MT1000A to more simply, accurately, and efficiently commission and verify high-speed mobile networks. Among the enhancements is a new module adding G.8275.1-compliant Precision Time Protocol (PTP) capabilities to the MT1000A handheld optical transport tester. Other capabilities include enhanced SyncE support for TD-LTE/LTE-Advanced networks, CPRI Automatic Protection Switching (APS) measurement, and automated one-button testing to simplify installation and maintenance of 4G/5G networks.
With the new PTP module, the MT1000A supports the max |TE|, cTE, and dTE metrics, allowing users to conduct high accuracy time and phase network verification measurements in accordance with the G827x Time Sync standard. The all-in-one handheld transport tester is a complete optical transport test solution that performs both Ethernet circuit tests, such as RFC 2544 and ITU-T Y.1564, as well as synchronization signal distribution function tests.
The MT1000A also has built-in CPRI testing interfaces supporting CPRI-defined data rates up to 10,137.6 Mb/s for easy network monitoring using alarm analyses, transmission delay measurements, and passthrough connections. A new APS measurement capability expands the CPRI support and allows the MT1000A to help assure the network is provisioned for quick and reliable switchover in the event of a failure.
The new modules and features have been developed to ensure transmission of high-quality wireless signals and distribution of mobile backhaul base station synchronization signals. With the expanded test capability, the Network Master Pro MT1000A is ideal for installation and maintenance of 4G/5G mobile networks.
Compact, battery-powered and easy-to-use, the MT1000A has everything needed to install and maintain communication networks and network elements from 1.5 Mb/s to 10 Gb/s, including OTDR and IEC 61300-3-35 based connector inspection. It features an easy-to-read 9-inch color display with simple indications and graphical symbols. An enhanced GUI allows measurements to be taken with a single button.
About the Author
Rick Nelson
Contributing Editor
Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.