Keysight announces E-band signal-analysis reference solution

Santa Rosa, CA. Keysight Technologies has announced an E-band signal-analysis reference solution to provide low-cost millimeter-wave analysis capability for applications in the 60- to 90-GHz range. The reference solution is based around the 10-bit ADC Infiniium S-Series oscilloscope to provide 2.5 GHz of high-fidelity, millimeter-wave analysis bandwidth.

The E-Band Signal Analysis Reference Solution provides a powerful test platform for analyzing emerging communication standards operating at millimeter-wave frequencies. Two-channel capability allows for testing of multichannel devices, different antenna polarizations simultaneously, and channel sounding measurements.

The reference solution is made up of a combination of hardware instruments and software. The new N8838A external mixer assistant software enables the S-Series oscilloscope to control the N5183B MXG X-Series microwave signal generator and the M1971E waveguide smart mixer. Also with the 89601B vector-signal-analysis software, engineers can make insightful measurements for complex signal analysis. This makes it simple to get accurate, calibrated measurements on E-band signals.

“With applications such as 5G, WiGig, automotive radar, and millimeter-wave backhaul becoming more prevalent, a simple-to-use, low-cost solution that maintains high performance is needed,” said Dave Cipriani, vice president and general manager of Keysight’s oscilloscope business. “This reference solution enables customers to develop these new technologies faster and more efficiently.”

More information about the E-band Signal Analysis Reference Solution is available at www.keysight.com/find/solution-e-bandsignalanalysis.

Keysight will show the new E-Band Signal Analysis Reference Solution at the International Microwave Symposium in San Francisco, May 22-27.

About the Author

Rick Nelson

Rick Nelson

Contributing Editor

Rick Nelson is a technical journalist who has served as executive editor of Test & Measurement World, chief editor of EDN, and executive editor of EE-Evaluation Engineering. He has also contributed to publications including Vision Systems Design and Electronic Design, and he has participated in many live panel discussions and webcasts. Rick has also held systems-engineering and product-development positions at General Electric and Litton Industries. He received his B.S.E.E. degree from The Pennsylvania State University.

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