Boston, MA. Anritsu is exhibiting test solutions and technologies that perform highly accurate measurements on high-frequency designs under development for 5G systems, as well as for military and aerospace applications, at EDI CON USA this week in Boston. Advanced systems integrating vector network analyzers (VNAs) that extend to 110 GHz, as well as signal analyzers that provide engineers with the frequency coverage and measurement capability necessary to confidently validate their high frequency designs, are on display.
Anritsu unveiled the Power Master MA24507A, an ultraportable USB power analyzer that enables simple, numeric, frequency-based measurement of RF power from 9 kHz to 70 GHz and that provides cost and performance advantages in many millimeter wave (mmWave) applications. What Anritsu calls the world’s first frequency-selectable RF power analyzer, the Power Master MA24507A leverages Anritsu’s patented Shockline technology to address the growing number of test requirements in mmWave applications.
Anritsu predicts many 5G designs will use E-band and millimeter-wave (mmWave) frequencies, and Anritsu demonstrated test solutions for these applications. The MS2840A signal analyzer with the MA2808A high performance waveguide mixer, along with the MG3697C signal generator, which can test wireless backhaul and automotive radar, are being shown. To test 5G components operating in the E-band, Anritsu is showcaseing the ShockLine two-port performance VNA with 60- to 90-GHz frequency coverage. The Power Master MA24507A is also suited for E-band designs.
In the EDI CON USA Signal Integrity Zone, the Anritsu ShockLine four-port MS46524B VNA is being paired with the Advanced Channel Modeling Platform from Wild River Technology. Further complementing the signal integrity platform is the VectorStar MS4647B four-port 70-GHz VNA, which is being exhibited in the Anritsu booth. Another VectorStar—the ME7838A Broadband VNA system—which has wide single frequency sweep capability from 70 kHz to 110 GHz, is being shown as well.
