Anritsu debuts 4×4 MIMO 256QAM measurement software

Oct. 27, 2016

Richardson, TX. Anritsu has introduced new software for its MT8821C radio communications analyzer that creates what the company calls the industry’s first test solution that supports evaluation of 4×4 MIMO 256QAM RF Rx performance for all DL 3CC CA band combinations with no restrictions on frequency and signal bandwidth. The new software provides wireless-chipset and UE manufacturers as well as mobile operators with a solution to conduct efficient, highly accurate carrier acceptance tests.

The new software complements the built-in LTE-Advanced RF TRx test base-station emulation functions of the all-in-one MT8821C. When the new 4×4 MIMO measurement software is installed on two synchronized MT8821C analyzers featuring existing LTE-Advanced DL 3CC CA measurement software, engineers can test the performance of chipsets and mobile devices to ensure their designs. By synchronizing two MT8821C instruments with the new software, up to 12 signals can be output for 4×4 MIMO 256QAM measurements to support all DL 3CC CA band combinations.

The new software strengthens the functions of the MT8821C and enhances Anritsu’s measurement solutions for facilitating deployment of LTE-Advanced broadband multifunction networks. The all-in-one MT8821C operates as a base-station simulator using standard call processing sequences compliant with test standards to support RF parametric tests through to UE functional and performance tests.

Overall operation of the MT8821C is improved by the enhanced next-generation GUI and easy-to-use large display that permit one-touch switching between grouped/individual graph lists and results outline/detail information. Efficiency is further improved by a parameter search function, bookmarking capability for commonly-used parameters, and the ability to set test parameters using one-touch button operation.

https://www.anritsu.com/en-us/test-measurement/products/mt8821c

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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