Anritsu debuts 56-Gbaud NRZ/PAM4 BER tester

Richardson, TX. Anritsu has introduced what the company calls the world’s first 56-Gbaud NRZ/PAM4 BER test solution that integrates the new 64-Gbaud PAM4 G0374A DAC with the MP1800A signal quality analyzer (SQA) and MP1862A 56G/64G DEMUX. The solution supports 53.125-Gbaud PAM4 transmission defined by the next-generation 400 GbE standard and was developed to address the need for scalable and flexible test solutions to verify next-generation communications devices, optical devices, and optical transceiver modules during the R&D stage.

The new easily expandable G0374A is used with the 32-Gb/s built-in pulse pattern generator (PPG) of the MP1800A to convert half-rate 32G NRZ signals and generate 64 Gbaud NRZ/PAM4 signals. Additionally, the 28G/32G error detector (ED) with high sensitivity of 25 mV that is built in to the MP1800A can be used with the 56/64 Gb/s MP1862A to generate wideband PAM4 signals up to 64 Gbaud to support highly accurate 400 GbE 53.125 Gbaud BER measurements.

The SQA MP1800A is a plug-in module type bit error rate tester (BERT) that can generate synchronous signals for up to eight channels using the built-in 32G multichannel PPG module. It features low intrinsic jitter of 300 fs RMS for accurate jitter tolerance tests. The scalable platform of the measurement solution maximizes equipment investment and controls future costs.

www.anritsu.com

About the Author

Rick Nelson

Rick Nelson

Contributing Editor

Rick Nelson is a technical journalist who has served as executive editor of Test & Measurement World, chief editor of EDN, and executive editor of EE-Evaluation Engineering. He has also contributed to publications including Vision Systems Design and Electronic Design, and he has participated in many live panel discussions and webcasts. Rick has also held systems-engineering and product-development positions at General Electric and Litton Industries. He received his B.S.E.E. degree from The Pennsylvania State University.

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