Keysight to demonstrate EW test, verification at AOC

Nov. 22, 2016

Santa Rosa, CA. Keysight Technologies today announced it will demonstrate flexible and cost-effective commercial-based electronic warfare (EW) test and verification solutions at the 53rd Annual AOC International Symposium and Convention November 29 through December 1 in Washington, DC.

The electromagnetic spectrum (EMS) threat environment is undergoing an unprecedented rate of change. Rapid evolution of advanced multifunction and adaptive systems are stressing legacy EW capabilities. As a result, defense agencies and EW systems developers are required to adapt much faster, reduce their product development time, lower overall costs, and improve the flexibility associated with addressing new EMS threats.

The limitations of traditional approaches to EW simulation, test, and verification are making it even more difficult for the EW industry to accomplish its product development goals. At the same time, these companies want to protect and reuse the decades of investment they have made in threat data and test scenario development. Furthermore, all of this needs to happen while addressing today’s new EW challenges. At AOC, Keysight will show how it is solving these problems with new and innovative approaches for the modern EW market.

Keysight experts will be available to discuss and showcase its latest EW simulation, test, and verification capabilities and solutions:

  • Keysight-validated, performance-optimized multi-emitter scenarios with AoA capability;
  • metrology-grade statistical pulse train and dual-rate jammer analysis;
  • 50-GHz handheld spectrum analyzer with real-time spectrum analysis;
  • SystemVue software solution with phased array beamforming, modeling, and analysis; and
  • a full complement of service and support offerings to optimize return on investment of test assets.

www.keysight.com

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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