Keysight launches ‘Test-Drive’ seminars to showcase design, test
Keysight Technologies has announced a series of one-day “Test-Drive” seminars, which will offer hands-on experience and presentations for Keysight RF signal analyzers, network analyzers, oscilloscopes, and bench instruments. Attendees will learn how the latest test and measurement solutions are used in real-world environments.
Each seminar will describe tools and techniques for optimizing RF transmitter and receiver measurements using the FieldFox microwave handheld analyzer, the X-Series signal analyzer, and the X-Series RF vector signal generator. Hands-on examples will involve characterizing the S-parameters of a filter and measuring interference, characterizing the phase noise of a CW signal, demodulating an LTE signal and determining EVM and ACP, and locating a low-level signal in the presence of noise.
Other topics include analog design (including test and verification), digital design (with a focus on capturing, isolating, and analyzing fast-signal errors) and power design (including characterization of low-power devices). Relevant Keysight products include the InfiniiVision oscilloscope, TrueVolt DMM, TrueForm waveform generator, and BenchVue software.
Each seminar will conclude with a session on power-integrity measurement and analysis using the Infiniium oscilloscope and Power Rail probe.
The first seminars are slated for February 7, 8, and 9 in Santa Clara. Thirty-two additional seminars will take place at locations throughout the United States and Canada through June 29.
About the Author
Rick Nelson
Contributing Editor
Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.