UXM wireless test set achieves 1-Gb/s IP throughput using ZTE’s Gigabit Phone

March 7, 2017

Santa Rosa, CA. Keysight Technologies announced that it has successfully demonstrated 1-Gb/s IP data throughput using its E7515A UXM wireless test set for functional and RF design validation with ZTE’s latest Gigabit Phone. The demonstration took place at Mobile World Congress 2017 in Barcelona, February 27 to March 2.

Keysight and ZTE have worked in concert to achieve sustained IP data downloads of 1 Gb/s by using a combination of three-component carrier aggregation (3CC), 4×4 downlink MIMO, and 256QAM modulation. Keysight said the E7515A UXM is the first wireless benchtop test set that supports full functional testing up to five component carrier (5CC) data throughput and 1.6-Gb/s data rates via 4CC carrier aggregation and 4×4 downlink MIMO.

“We are very pleased to have collaborated with ZTE to accomplish this important milestone pertaining to data throughput as 4G continues to evolve,” said Kailash Narayanan, vice president and general manager of Keysight’s Wireless Devices Segment. “Keysight is committed to working with today’s wireless leaders to enable the whole ecosystem, including chipset and device manufacturers, and to overcome critical design and test challenges with the help of our cutting-edge test solutions.”

High-speed connectivity increases the pace of innovation for the next generation of smartphone devices. This is why market-leading mobile device manufacturers are aiming to deliver 1-Gb/s peak data rates, which is equivalent to the performance achieved in LAN connections used in many fixed devices. Peak network speeds of 1 Gb/s helps to ensure fast and seamless file transfer of high-definition video content and opens doors to ever more sophisticated applications using virtual reality and networked gaming.

www.keysight.com/find/UXM

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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