Goepel announces SCANFLEX II CUBE JTAG/boundary-scan controller
Goepel electronic has announced SCANFLEX II CUBE, which it describes as the new generation of modular JTAG/boundary scan controllers. Based on the latest multi-core processors and FPGAs, SCANFLEX II CUBE opens new ways for embedded JTAG solutions, the company said. This test and validation method uses embedded instruments to test and program complex boards. This results in a high test depth with less use of external test hardware.
The multifunctional architecture of the SCANFLEX II CUBE allows users to combine
numerous technologies flexibly and with high performance on a single platform. Embedded board test offers the advantage of a significantly improved test depth for complex boards even without the need for needles. For example, an embedded functional test can be implemented while embedded programming makes external programmers unnecessary.
Eight independent, parallel test access ports (TAPs) for up to 100 MHz enable synchronized execution of test, debug, and programming operations via embedded JTAG solutions (boundary scan, processor emulation, chip-embedded instruments). SCANFLEX II CUBE can be controlled via USB 3.0 and LAN.
Goepel electronic is a provider of innovative test and inspection solutions for PCBAs and electronic devices and systems. The company is divided into four divisions:
- automotive test solutions,
- embedded JTAG solutions,
- industrial functional test, and
- AOI, AXI, SPI, and IVS inspection solutions.
