Goepel announces SCANFLEX II CUBE JTAG/boundary-scan controller
Goepel electronic has announced SCANFLEX II CUBE, which it describes as the new generation of modular JTAG/boundary scan controllers. Based on the latest multi-core processors and FPGAs, SCANFLEX II CUBE opens new ways for embedded JTAG solutions, the company said. This test and validation method uses embedded instruments to test and program complex boards. This results in a high test depth with less use of external test hardware.
The multifunctional architecture of the SCANFLEX II CUBE allows users to combine
Eight independent, parallel test access ports (TAPs) for up to 100 MHz enable synchronized execution of test, debug, and programming operations via embedded JTAG solutions (boundary scan, processor emulation, chip-embedded instruments). SCANFLEX II CUBE can be controlled via USB 3.0 and LAN.
Goepel electronic is a provider of innovative test and inspection solutions for PCBAs and electronic devices and systems. The company is divided into four divisions:
- automotive test solutions,
- embedded JTAG solutions,
- industrial functional test, and
- AOI, AXI, SPI, and IVS inspection solutions.
About the Author
Rick Nelson
Contributing Editor
Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.