Microchip unveils next-generation in-circuit debugger

Chandler, AZ. Microchip Technology Inc. has announced the MPLAB ICD 4, an in-circuit programming and debugging development tool for Microchip’s PIC microcontroller (MCU) and dsPIC digital signal controller portfolios. The MPLAB ICD 4 debugger includes all the features of the MPLAB ICD 3 tool while adding increased speed through a faster processor and increased RAM.

The MPLAB ICD 4’s improvement in speed is accomplished through a 32-bit MCU running at 300 MHz. The faster processing, along with an increased buffer memory of 2 MB, results in a product that is up to twice as fast as its predecessor.

The puck-shaped MPLAB ICD 4 is housed in a durable, black case with a brushed aluminum top and is accented with an LED light strip to indicate debugging status. The tool offers the following features:

  • a wider target voltage range, from 1.20 to 5.5 V;
  • selectable pull-up/pull-down option to the target interface;
  • configurable interface speed for optimized programming and debugging;
  • intelligent, robust interface with fault detection and immunity; and
  • JTAG debugging capability.

Microchip’s MPLAB ICD 4 development tool is easy to use and supports all PIC microcontrollers and dsPIC digital signal controllers in Microchip’s portfolio through the MPLAB X integrated development environment (IDE). This simplifies the design process for customers when they choose to migrate from one PIC MCU to another to meet the needs of their application.

“Speed and flexibility are the most important factors when selecting a debugging tool,” said Rodger Richey, Microchip’s director of development tools. “The MPLAB ICD 4 reduces wait time and in turn improves debugging productivity. With speed, compatibility, durability, comprehensive device support, and the award-winning MPLAB X IDE, the MPLAB ICD 4 again solidifies Microchip’s reputation as a leading provider of embedded debugging tools.”

The MPLAB ICD 4 (DV164045) is available today for $249.95.

www.microchip.com/ICD4

About the Author

Rick Nelson

Rick Nelson

Contributing Editor

Rick Nelson is a technical journalist who has served as executive editor of Test & Measurement World, chief editor of EDN, and executive editor of EE-Evaluation Engineering. He has also contributed to publications including Vision Systems Design and Electronic Design, and he has participated in many live panel discussions and webcasts. Rick has also held systems-engineering and product-development positions at General Electric and Litton Industries. He received his B.S.E.E. degree from The Pennsylvania State University.

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