The International Test Conference convenes Sunday October 29 in Fort Worth, TX. Organizers have announced a keynote speaker, four panel sessions, and 12 tutorials. Register on or before October 1 for discount rates.
The plenary keynote speaker, who will deliver his talk Tuesday October 31, is Robert Klosterboer, executive vice president and general manager of the Analog Solutions Group at ON Semiconductor. He will discuss “testing beyond the green light.”
His presentation will highlight the challenges and opportunities that test developers and test operations managers face in a changing data climate. He will contend that measured data will drive decisions not only about the product under test but potentially on the entire design and manufacturing ecosystem. Klosterboer will also explore some the value tradeoffs of increased data harvesting vs. reduced test cost requirements of each component.
Klosterboer joined ON Semiconductor in March 2008. From March 2008 to September 2012 he was senior vice president and general manager of the business unit then known as the Automotive, Industrial, Medical, & Mil/Aero Group. He has more than two decades of experience in the electronics industry. During his career,. Klosterboer has held various engineering, marketing, and product line management positions.
Automotive, SLT, yield-learning panels
ITC will include four panel discussions. Make sure your travel plans get you to Fort Worth on Monday October 30 in time to catch the 4:30 p.m. panel on automotive safety and security. Moderator Mark Tehranipoor of the University of Florida will lead a discussion among panelists Yervant Zorian of Synopsys, Riccardo Mariani of Intel, Ken Modeste of Underwriters Laboratories, and Swarup Bhunia of the University of Florida.
The panelists will note that cars are getting more complex as they take on more hardware, software, and networks, with networks being linked to the outside world. The panel will survey the chore challenges of automotive security.
Three additional panels are scheduled for Thursday, November 2, including another panel on automotive topics.
Additional Thursday panel titles include “What does the Test Community really think about System-Level Test?” and “Yield Learning at the Crossroads—Test Chips to the Rescue?
Test Week tutorials
If you plan to attend the Test Week tutorials, make sure you’re in Fort Worth Sunday morning October 29. Sunday will see six tutorials, followed Monday by six more. Sunday’s topics include interconnected IEEE standards, high-speed I/O testing, learning techniques for reliability monitoring, zero defects through cell-aware fault models and adaptive test, mixed-signal DFT and BIST, and machine learning.
Monday’s tutorial topics include automotive reliability, testing of TSV-based stacked ICs, data analytics, FinFET memory test and repair, board and system test and diagnosis, and post-silicon validation.
Visit the tutorial page for more information.
