Xcerra Diamondx

Xcerra ships its 500th Diamondx test system to Microchip Technology

July 17, 2018

Norwood, MA. Xcerra today announced that it has shipped the 500th DiamondX test system, reaching a critical milestone for Xcerra’s flagship system-on-a-chip (SoC) tester. The 500th test system was delivered to Microchip Technology. Microchip will add to its installed base of DiamondX testers in support of high-volume production test of devices supplied into the automotive, consumer, and industrial markets.

The capabilities of the DiamondX provide customers with the ability to use a test system that incorporates the latest technology for delivering low cost of test while offering instrumentation that can support a range of performance requirements including precision analog, high-speed SerDes digital, and mmWave RF. The architecture of the Diamondx incorporates unique capabilities such as an Integrated Multi-System Architecture, or IMA, that allows customers to better match the test requirements of a device with the cost profile of the test system, thereby achieving the lowest cost of test.

Ganesh Moorthy, president and chief operating officer at Microchip Technology, commented, “DamondX is not only used for testing microcontrollers; we also rely on the system for high-volume manufacturing test of our wireless, networking (USB, Ethernet, MOST, etc.), touch-controller, and other mixed-signal products. Xcerra provides outstanding technical support in all phases of test development and high-volume production test, and when combined with the economics delivered by the DiamondX, this creates a powerful combination.”

David Tacelli, president and chief executive officer for Xcerra, commented, “Our goal is to develop the semiconductor test solutions that deliver a powerful combination of performance and economic value complemented by world-class customer support. The growing adoption of the DiamondX by top tier semiconductor suppliers such as Microchip is validation that our strategy is succeeding.”



About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

Sponsored Recommendations


To join the conversation, and become an exclusive member of Electronic Design, create an account today!