Xcerra ships its 500th Diamondx test system to Microchip Technology
Norwood, MA. Xcerra today announced that it has shipped the 500th DiamondX test system, reaching a critical milestone for Xcerra’s flagship system-on-a-chip (SoC) tester. The 500th test system was delivered to Microchip Technology. Microchip will add to its installed base of DiamondX testers in support of high-volume production test of devices supplied into the automotive, consumer, and industrial markets.
Ganesh Moorthy, president and chief operating officer at Microchip Technology, commented, “DamondX is not only used for testing microcontrollers; we also rely on the system for high-volume manufacturing test of our wireless, networking (USB, Ethernet, MOST, etc.), touch-controller, and other mixed-signal products. Xcerra provides outstanding technical support in all phases of test development and high-volume production test, and when combined with the economics delivered by the DiamondX, this creates a powerful combination.”
David Tacelli, president and chief executive officer for Xcerra, commented, “Our goal is to develop the semiconductor test solutions that deliver a powerful combination of performance and economic value complemented by world-class customer support. The growing adoption of the DiamondX by top tier semiconductor suppliers such as Microchip is validation that our strategy is succeeding.”
About the Author
Rick NelsonRick Nelson
Contributing Editor
Rick Nelson is a technical journalist who has served as executive editor of Test & Measurement World, chief editor of EDN, and executive editor of EE-Evaluation Engineering. He has also contributed to publications including Vision Systems Design and Electronic Design, and he has participated in many live panel discussions and webcasts. Rick has also held systems-engineering and product-development positions at General Electric and Litton Industries. He received his B.S.E.E. degree from The Pennsylvania State University.
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