Rohde & Schwarz
thumbnail_51056_02_200_16660
thumbnail_51056_02_200_16660
thumbnail_51056_02_200_16660
thumbnail_51056_02_200_16660
thumbnail_51056_02_200_16660

Automotive Radar Sensor Reference Design Verified for Short Object Distances

Dec. 22, 2023
Rohde & Schwarz verifies NXP’s next-generation automotive radar sensor reference design for extremely short object distances.

The R&S RTS radar target simulator from Rohde & Schwarz can electronically simulate very close-range objects, and has been used to verify the performance of NXP Semiconductors’ next-generation radar sensor reference design. Engineers from both companies conducted a comprehensive series of tests to verify the sensor reference design, based on NXP’s SAF85xx 28-nm RFCMOS radar one-chip SoC.

Combining the R&S AREG800A automotive radar echo generator and the R&S QAT100 antenna mmWave front end, the R&S RTS radar test system offers short-distance object simulation capabilities as well as RF performance and advanced signal processing, with many advanced functions.

NXP’s next-generation automotive radar sensor reference design leverages the first 28-nm RFCMOS radar one-chip SoC family, and can be used for short, medium, and long-range radar applications. It's intended to serve challenging New Car Assessment Program (NCAP) safety requirements as well as comfort functions like highway pilot or urban pilot for L2+ and L3 vehicles.

The R&S RTS is presented as the only test system suitable for complete characterization of radar sensors and radar echo generation with object distances down to the airgap value of the radar under test. The test solution is suitable for the whole automotive radar lifecycle, including development lab, hardware-in-the-loop (HIL), vehicle-in-the-loop (VIL), validation, and production application requirements. The fully scalable solution can emulate the most complex traffic scenarios for advanced driver-assistance systems (ADAS).

According to Adi Baumann, Senior Director ADAS R&D, at NXP Semiconductors, “We have been collaborating closely and successfully with Rohde & Schwarz for many years on the verification of our automotive radar sensor reference designs. Rohde & Schwarz’s cutting-edge automotive radar test systems allows us high-quality and highly efficient validation of our automotive radar products and proves outstanding performance of our radar one-chip. The level of experience, quality, and support that Rohde & Schwarz provides to NXP is making a difference.”

Gerald Tietscher, Vice President Signal Generators, Power Supplies and Meters from Rohde & Schwarz added, “We are grateful for the collaboration with NXP to accelerate the deployment of advanced automotive radar sensors based on 28-nm automotive radar chips. They serve ever more challenging NCAP safety requirements and will help enable new safety applications. Our experience in automotive radar testing allows us to provide a best-in-class test solution for this radar sensor design based on the industry’s first 28-nm RFCMOS one-chip radar SoC.”

Related links:

Comments

To join the conversation, and become an exclusive member of Electronic Design, create an account today!