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White Paper: Safe Operating Area -- Improving Reliability by Monitoring Device Stress Limits
Nov. 12, 2010
Download this brief form to access these two important application notes from LeCroy:
Safe Operating Area --Improving Reliability By monitoring Device Stress Limits
Power Device Analysis-- Measuring Power Loss in Switched Mode Power Supplies.
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Solving the contact resistance challenge for 7nm and beyond CMOS
Use an LDO and PLD for Power-Supply Enable and Disable Functions
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