Test & Measurement: Multigigabit/s Analyzers Combine BER Testing, Eye-Diagram Analysis

April 26, 2004
Bit-error-rate (BER) pattern generation and analysis merges with eye-diagram analysis on the BertScope 100-Mbit/s to 7.5-Gbit/s 7500A and 100-Mbit/s to 12.5-Gbit/s 12500A analyzers. Using the company's BitAnalyzer Error Location analysis, they swiftly...

Bit-error-rate (BER) pattern generation and analysis merges with eye-diagram analysis on the BertScope 100-Mbit/s to 7.5-Gbit/s 7500A and 100-Mbit/s to 12.5-Gbit/s 12500A analyzers. Using the company's BitAnalyzer Error Location analysis, they swiftly identify pattern- and frequency-dependent errors. Proprietary (sub-picosecond) high-resolution self-calibrating delay lines enable accurate measurement and separation of jitter into deterministic and random components. Priced at $95,000, the 7500A analyzer can be upgraded to a 12500A at an additional charge. The 12500A analyzer costs $135,000.

SyntheSys Research Inc. www.synthesysresearch.com (650) 364-1853

About the Author

Roger Allan

Roger Allan is an electronics journalism veteran, and served as Electronic Design's Executive Editor for 15 of those years. He has covered just about every technology beat from semiconductors, components, packaging and power devices, to communications, test and measurement, automotive electronics, robotics, medical electronics, military electronics, robotics, and industrial electronics. His specialties include MEMS and nanoelectronics technologies. He is a contributor to the McGraw Hill Annual Encyclopedia of Science and Technology. He is also a Life Senior Member of the IEEE and holds a BSEE from New York University's School of Engineering and Science. Roger has worked for major electronics magazines besides Electronic Design, including the IEEE Spectrum, Electronics, EDN, Electronic Products, and the British New Scientist. He also has working experience in the electronics industry as a design engineer in filters, power supplies and control systems.

After his retirement from Electronic Design Magazine, He has been extensively contributing articles for Penton’s Electronic Design, Power Electronics Technology, Energy Efficiency and Technology (EE&T) and Microwaves RF Magazine, covering all of the aforementioned electronics segments as well as energy efficiency, harvesting and related technologies. He has also contributed articles to other electronics technology magazines worldwide.

He is a “jack of all trades and a master in leading-edge technologies” like MEMS, nanolectronics, autonomous vehicles, artificial intelligence, military electronics, biometrics, implantable medical devices, and energy harvesting and related technologies.

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