Test & Measurement: SAN Tester Cuts Costs And Speeds Time-To-Market

June 7, 2004
Addressing the 4-Gbit/s Fibre Channel standard, the dual-speed (2- and 4-Gbit/s) 1733A storage-area-network (SAN) tester cuts device costs by 97% and accelerates time-to-market. It is built on the existing 1-Gbit/s 1730A and 2-Gbit/s 1730B, so it fits...

Addressing the 4-Gbit/s Fibre Channel standard, the dual-speed (2- and 4-Gbit/s) 1733A storage-area-network (SAN) tester cuts device costs by 97% and accelerates time-to-market. It is built on the existing 1-Gbit/s 1730A and 2-Gbit/s 1730B, so it fits in the same platform as the previous models. Also, it can be used simultaneously with either unit. The 1733A offers device visualization, host-bus adapter behavior emulation, fiber-connection device initialization, and a capture buffer for failure analysis. Up to 2000 devices can be emulated in a 2U chassis, compared to fewer than 10 devices using previous models, at a fraction of the cost. The 1733A costs $40,000.

Agilent Technologieswww.agilent.com

About the Author

Roger Allan

Roger Allan is an electronics journalism veteran, and served as Electronic Design's Executive Editor for 15 of those years. He has covered just about every technology beat from semiconductors, components, packaging and power devices, to communications, test and measurement, automotive electronics, robotics, medical electronics, military electronics, robotics, and industrial electronics. His specialties include MEMS and nanoelectronics technologies. He is a contributor to the McGraw Hill Annual Encyclopedia of Science and Technology. He is also a Life Senior Member of the IEEE and holds a BSEE from New York University's School of Engineering and Science. Roger has worked for major electronics magazines besides Electronic Design, including the IEEE Spectrum, Electronics, EDN, Electronic Products, and the British New Scientist. He also has working experience in the electronics industry as a design engineer in filters, power supplies and control systems.

After his retirement from Electronic Design Magazine, He has been extensively contributing articles for Penton’s Electronic Design, Power Electronics Technology, Energy Efficiency and Technology (EE&T) and Microwaves RF Magazine, covering all of the aforementioned electronics segments as well as energy efficiency, harvesting and related technologies. He has also contributed articles to other electronics technology magazines worldwide.

He is a “jack of all trades and a master in leading-edge technologies” like MEMS, nanolectronics, autonomous vehicles, artificial intelligence, military electronics, biometrics, implantable medical devices, and energy harvesting and related technologies.

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