Test & Measurement: Network-Tester Option Adds Support For Upcoming ITU-T Jitter Standard

Aug. 9, 2004
A high-precision jitter-analysis option for the MP1590A network performance tester delivers ±20-mUI p-p accuracy in jitter measurement. Dubbed the MP1590A-30, it supports the phase-analysis method recommended in the revised International...

A high-precision jitter-analysis option for the MP1590A network performance tester delivers ±20-mUI p-p accuracy in jitter measurement. Dubbed the MP1590A-30, it supports the phase-analysis method recommended in the revised International Telecommunications Union (ITU) T Draft 0.172 (2003.11) standard. It also has no-measurement repeatability of ±5 mUI p-p as well as a very low intrinsic jitter of 50 mUI p-p. This allows for accurate jitter analysis on SDH/Sonet, OTU-1, and OTU-2 transmission equipment. The option costs $20,000, and the mainframe is $57,285. Lead time is four to six weeks.

Anritsu Co. www.us.anritsu.com; (800) 267-4878

About the Author

Roger Allan

Roger Allan is an electronics journalism veteran, and served as Electronic Design's Executive Editor for 15 of those years. He has covered just about every technology beat from semiconductors, components, packaging and power devices, to communications, test and measurement, automotive electronics, robotics, medical electronics, military electronics, robotics, and industrial electronics. His specialties include MEMS and nanoelectronics technologies. He is a contributor to the McGraw Hill Annual Encyclopedia of Science and Technology. He is also a Life Senior Member of the IEEE and holds a BSEE from New York University's School of Engineering and Science. Roger has worked for major electronics magazines besides Electronic Design, including the IEEE Spectrum, Electronics, EDN, Electronic Products, and the British New Scientist. He also has working experience in the electronics industry as a design engineer in filters, power supplies and control systems.

After his retirement from Electronic Design Magazine, He has been extensively contributing articles for Penton’s Electronic Design, Power Electronics Technology, Energy Efficiency and Technology (EE&T) and Microwaves RF Magazine, covering all of the aforementioned electronics segments as well as energy efficiency, harvesting and related technologies. He has also contributed articles to other electronics technology magazines worldwide.

He is a “jack of all trades and a master in leading-edge technologies” like MEMS, nanolectronics, autonomous vehicles, artificial intelligence, military electronics, biometrics, implantable medical devices, and energy harvesting and related technologies.

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