70-GHz Modular Sampling Scope Measures 200-fs System Jitter

Aug. 23, 2004
The TDS8200 modular sampling oscilloscope and 82A04 phase-reference module from Tektronix enable system jitter measurements of 200 fs rms. According to the company, these devices represent performance benchmarks for testing high-speed serial data...

The TDS8200 modular sampling oscilloscope and 82A04 phase-reference module from Tektronix enable system jitter measurements of 200 fs rms. According to the company, these devices represent performance benchmarks for testing high-speed serial data signals from 2.0 to 12.5 Gbits/s.

The TDS8200 single-ended and differential clock-recovery sampling oscilloscope covers all emerging serial-data transmission standards from 50 Mbits/s to 12.5 Gbits/s. It can be configured with plug-in modules to provide bandwidths up to 70 GHz. The scope features up to eight input channels, a reflected rise time of 35 ps, and four color-coded variable-persistence waveform databases. Low-jitter measurements are possible using both conventional free-run and triggered operating modes.

The 8204A incorporates a reference clock with an optional continuous input frequency range of 2 to 60 GHz (2 to 25 GHz without an option). Combined with the Tektronix 80E0x electrical signal-acquisition module, it provides total electrical signal analysis and clock recovery for differential and single-ended signals.

The TDS8200 oscilloscope costs $20,490, while the 82A04 module goes for $28,990.

Tektronix Inc.www.tektronix.com (800) 833-9200

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About the Author

Roger Allan

Roger Allan is an electronics journalism veteran, and served as Electronic Design's Executive Editor for 15 of those years. He has covered just about every technology beat from semiconductors, components, packaging and power devices, to communications, test and measurement, automotive electronics, robotics, medical electronics, military electronics, robotics, and industrial electronics. His specialties include MEMS and nanoelectronics technologies. He is a contributor to the McGraw Hill Annual Encyclopedia of Science and Technology. He is also a Life Senior Member of the IEEE and holds a BSEE from New York University's School of Engineering and Science. Roger has worked for major electronics magazines besides Electronic Design, including the IEEE Spectrum, Electronics, EDN, Electronic Products, and the British New Scientist. He also has working experience in the electronics industry as a design engineer in filters, power supplies and control systems.

After his retirement from Electronic Design Magazine, He has been extensively contributing articles for Penton’s Electronic Design, Power Electronics Technology, Energy Efficiency and Technology (EE&T) and Microwaves RF Magazine, covering all of the aforementioned electronics segments as well as energy efficiency, harvesting and related technologies. He has also contributed articles to other electronics technology magazines worldwide.

He is a “jack of all trades and a master in leading-edge technologies” like MEMS, nanolectronics, autonomous vehicles, artificial intelligence, military electronics, biometrics, implantable medical devices, and energy harvesting and related technologies.

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