Electronicdesign Com Products Test And Measurement Probing Station Handles 200 Mm Assignments17819
Electronicdesign Com Products Test And Measurement Probing Station Handles 200 Mm Assignments17819
Electronicdesign Com Products Test And Measurement Probing Station Handles 200 Mm Assignments17819
Electronicdesign Com Products Test And Measurement Probing Station Handles 200 Mm Assignments17819
Electronicdesign Com Products Test And Measurement Probing Station Handles 200 Mm Assignments17819

Probing Station Handles 200-mm Assignments

Aug. 1, 1999
Providing ultra-low CV-IV probing specifically for 200 mm, 12860 wafer probing station uses firm's AttoGuard technology that provides an ultra-low capacitance variation of less than 3 fF, as well as an ultra-low, 1-pF thermal chuck along with a fast

Providing ultra-low CV-IV probing specifically for 200 mm, 12860 wafer probing station uses firm's AttoGuard technology that provides an ultra-low capacitance variation of less than 3 fF, as well as an ultra-low, 1-pF thermal chuck along with a fast settling time of less than 50 fA in 50 ms with a 100V step. The chuck leakage and noise is less than 20 fA over a -65°C to 300°C temperature range. The AttoGuard presents a constant potential to the wafer regardless of the position of the chuck, providing a complete shield to atto Farad levels of capacitance. This helps simplify the making of measurements such as gate overlap capacitance or sub-threshold current of sub-micron devices.

Company: CASCADE MICROTECH INC.

Product URL: Click here for more information

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