Isolated Probes Increase Measurement Confidence

Teledyne LeCroy launched the DL-ISO high-voltage optically isolated 1-GHz probe family and power-device test software, which offer accurate electrical characterization of wide-bandgap power semiconductor devices.

Alix Paultre

Related To:

Electronic Design

July 12, 2022

Check out our embedded world 2022 coverage.

Teledyne LeCroy's DL-ISO high-voltage optically isolated 1-GHz probe family and power-device test software offer accurate electrical characterization of wide-bandgap power semiconductor devices. With 1 GHz of bandwidth, 2500-V differential input range, and 60-kV common mode, DL-ISO probes suit both gallium-nitride (GaN) and silicon-carbide (SiC) device characterization and system development.

You can combine DL-ISO probes with 12-bit-resolution high-definition oscilloscopes (HDOs) to achieve 1.5% system accuracy. DL-ISO probes increase measurement confidence by using high-quality coaxial attenuating tips that reject unwanted noise and terminate into test boards using standard MMCX connectors or high-voltage safe square pin headers.

For more embedded world 2022 videos, CLICK HERE.

About the Author

Alix Paultre

Editor-at-Large, Electronic Design

An Army veteran, Alix Paultre was a signals intelligence soldier on the East/West German border in the early ‘80s, and eventually wound up helping launch and run a publication on consumer electronics for the US military stationed in Europe. Alix first began in this industry in 1998 at Electronic Products magazine, and since then has worked for a variety of publications in the embedded electronic engineering space. Alix currently lives in Wiesbaden, Germany.

Also check out his YouTube watch-collecting channel, Talking Timepieces.