EE Product News

Long-Wire ZIF Probe Tip Eases DDR/GDDR Validation

In collaboration with Hynix Semiconductor, the company unveils a high-bandwidth, high-performance long-wire ZIF probe tip optimized for DDR and GDDR SDRAM validation. Groomed for use with the InfiniiMax and ZIF probing system, the probe tip allows engineers to make accurate measurements of high-speed signals when probing signals located farther apart and to probe hard-to-reach locations on a DRAM chip while maintaining signal integrity. Its design also enables users to easily switch between the multiple signals they need to probe on a SDRAM device. Price for the N5451A InfiniiMax differential long-wire ZIF tips is $467 for a kit of 10 ZIF probe tip accessories. AGILENT TECHNOLOGIES INC., Santa Clara, CA. (800) 829-4444.


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