An interactive tutorial CD that helps test engineers overcome tough measurement challenges, the Simplified Test Toolkit is free of charge from Keithley Instruments. The CD offers a collection of technical seminars to help engineers develop more powerful and effective, yet simple, test and measurement applications. Some of the topics covered include:
- software-defined radio architecture and next-generation rf instrumentation,
- meeting new challenges in wafer-level reliability testing,
- making successful electrical measurements on nanoscale materials, and
- advances in testing—the advantages of on-board test sequencing.
The CD also contains technical presentations on the company's test and measurement systems, including the Series 2600 SourceMeter instruments, the Model 4200-SCS semiconductor characterization system with pulse I-V capabilities, the Series 3400 pulse/pattern generators, and the Models 2810 rf vector signal analyzer and 2910 rf vector signal generator. Users can also request individualized configuration assistance or a quote on any of the company test and measurement products.
For more information or to request a copy of the Simplified Test Toolkit, go to www.keithley.com/pr/068.