CD Offers Help With Tough Test Problems

An interactive tutorial CD that helps test engineers overcome tough measurement challenges, the Simplified Test Toolkit is free of charge from Keithley Instruments. The CD offers a collection of technical seminars to help engineers develop more powerful and effective, yet simple, test and measurement applications. Some of the topics covered include:

• software-defined radio architecture and next-generation rf instrumentation,
• meeting new challenges in wafer-level reliability testing,
• making successful electrical measurements on nanoscale materials, and
• advances in testing—the advantages of on-board test sequencing.

The CD also contains technical presentations on the company's test and measurement systems, including the Series 2600 SourceMeter instruments, the Model 4200-SCS semiconductor characterization system with pulse I-V capabilities, the Series 3400 pulse/pattern generators, and the Models 2810 rf vector signal analyzer and 2910 rf vector signal generator. Users can also request individualized configuration assistance or a quote on any of the company test and measurement products.

For more information or to request a copy of the Simplified Test Toolkit, go to www.keithley.com/pr/068.