EE Product News

Digital Module Has Programmable Voltage

The cost of digital testing can be dramatically reduced, it's claimed, with a boundary-scan controlled ScanIO-280LV digital module with programmable voltage levels. The device is targeted at development, manufacturing and service test applications for both pc boards and complex ICs. The module provides 288 boundary-scan controlled bi-directional I/O pins that can be used to add test coverage to non-scanable or partially scanable circuit boards and ICs.
The modules can be cascaded to support thousands of I/Os. Applications include production test, service diagnostics, and prototype debugging of both pc boards as well as digital ICs, including ASICs and MCMs. The digital I/O pins of the modules can be connected to the device under test using conventional techniques. Call for pricing.


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