Electronic Design

Improved JTAG Package Boosts Coverage While Cutting Development Time

Version 3.2 of the ScanWorks boundary-scan (IEEE 1149.1/JTAG) test and in-system programming environment includes next-generation interconnect tools that improve test coverage and speed up the test-development process. These tools enhance boundary-scan test coverage even when components on the pc board don't have boundary-scan capability, the company claims. Also, new algorithms and database techniques make ScanWorks significantly faster, reducing test development time from 30% to 50%. Version 3.2's improved integrated design browser generates a view of the board under test based on information from electronic design automation (EDA) systems. This lets engineers correlate boundary-scan test information and design data within ScanWorks and without access to the EDA system.

A ScanWorks Version 3.2 license for a test-development station costs from $25,000 to $50,000, depending on options and features.

Asset InterTech Inc.
(888) 694-6250; www.asset-intertech.com

Hide comments


  • Allowed HTML tags: <em> <strong> <blockquote> <br> <p>

Plain text

  • No HTML tags allowed.
  • Web page addresses and e-mail addresses turn into links automatically.
  • Lines and paragraphs break automatically.