Near Field Probes

Langer near-field probes enable precise measurement of electric and magnetic fields directly on PCBs and electronic assemblies. They help developers identify emission sources and trace RF coupling paths with confidence. Various probe families and probe heads support applications ranging from source localization to high-resolution EMC analysis. With frequency coverage from 100 kHz to 40 GHz and excellent field separation, they deliver reliable and meaningful EMC insights throughout the development process.

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