Tek007 Image 8 Series Sampling Oscilloscope 5f48d7ba7bfbf

Tektronix's 8 Series Sampling Oscilloscope Platform Supports 56GBd and 28GBd

Aug. 28, 2020
Optical transceiver test platform reduces test time and boasts repeatability, addressing test challenges for optical manufactures to meet the demand for increased bandwidth and network capacity

Tektronix released the 8 Series sampling platform, a disaggregated modular instrument series boasting parallel acquisition, with up to 4 channels per mainframe. Presented as having the highest measurement accuracy for PAM4 optical signals on multiple inputs simultaneously, the 8 Series consists of the TSO820 Sampling Oscilloscope Mainframe, optical sampling modules, and TSOVu. TSOVu is a new software platform that runs independent of the mainframe on host PC, for both live and offline processing of acquired data. Tektronix also introduced the TCR801, an external optical clock-recovery module covering dual band ranges around both 26GBd and 53GBd. 

The 8 Series’ mainframe is a configurable, compact instrument claimed as the smallest modular form factor in the market, at 3U high. Built to maximize the use of the rack space, this instrument is ideal for optical manufacturing applications, where users can quickly add new analysis capabilities and reconfigure test systems to support upcoming standards and changes in workflow. Offline and remote modes of operation extend the analysis and visualization capability facilitate seamless transition from design phase to debug, characterization, and manufacturing test. 

The TCR801 Optical Clock Recovery instrument works with new and existing test equipment, including the TSO820 and DSA8300. This single-mode external instrument has a FC/PC optical connection for PAM4 and NRZ, with external optical splitters. The TSOVu software platform enables an external computing environment with a comprehensive programmatic interface boosting automation. This software solution also offers a new measurement plug-in architecture, enabling quick iterations of existing measurements as well as future customer-defined measurements.

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