Desktop Flash Memory Tester Performs Quick Characterizations

July 22, 2002

Designed for quick characterization and debug of emerging sub-2.0-V flash memory devices, the Personal Kalos XZ desktop tester presents less than 20 pF of capacitance to the device under test (DUT), creating a test environment that reflects the memories' end use. The system allows engineers to save time in the design cycle. Memories can be transferred to a high-volume production tester for an efficient device flow from design to production testing. Operating at up to 100 MHz, the tester offers 96 I/O pins. It achieves its low capacitance by placing a buffer almost directly under the DUT. The system includes 16 channels per board of the low-capacitance buffered pins. Pricing starts at $18,000. Delivery is from stock.

Credence Systems Corp.
www.credence.com; (510) 657-7400

About the Author

David Maliniak

MWRF Executive Editor

In his long career in the B2B electronics-industry media, David Maliniak has held editorial roles as both generalist and specialist. As Components Editor and, later, as Editor in Chief of EE Product News, David gained breadth of experience in covering the industry at large. In serving as EDA/Test and Measurement Technology Editor at Electronic Design, he developed deep insight into those complex areas of technology. Most recently, David worked in technical marketing communications at Teledyne LeCroy. David earned a B.A. in journalism at New York University.