DAC And IMS Shows Offer An Early Peek At Critical Technologies

May 1, 2004
Why do important conferences always seem to take place at the same time? For example, both the Design Automation Conference (www.dac.com/41st) and the IEEE International Microwave Symposium (www.ims2004.org) take...

Why do important conferences always seem to take place at the same time? For example, both the Design Automation Conference (www.dac.com/41st) and the IEEE International Microwave Symposium (www.ims2004.org) take place the week of June 7, 2004. Both conferences offer topics and exhibits that are crucial to the design of today's wireless systems. Yet their scheduling makes it difficult—albeit not impossible—for engineers to attend both shows. To help those engineers stay informed, this section highlights products from both conferences.

First, consider the world of electronic design tools. Most electronic-design-automation (EDA) companies are just now recovering from the technology slump of the last several years. Many are doing so with a renewed awareness of the "bottom line." This trend has not escaped the notice of the planners of this year's Design Automation Conference (DAC). In addition to a strong technical program, the conference features an expanded business-related session. Called "Business Day at DAC," it includes a track on the intersection of business and technology issues. DAC will be held from June 7 to 9 at the San Diego Convention Center in San Diego, Calif.

Meanwhile, Fort Worth, Texas will be hosting the IEEE IMS show from June 6 to 11. This show covers the RF—specifically microwave—portion of wireless designs. The symposium works to include everything that's needed in the development of RF subsystems. Topics vary from contemporary issues, such as EDA flows in RFICs and UWB technologies, to the equally important yet more mundane tasks of selecting between an organic or ceramic board.

Of course, both show floors will be lined with products and more products. The following pages provide a glimpse of some of the hottest products to grace the floors of this year's DAC and IMS.

About the Author

John Blyler

John Blyler has more than 18 years of technical experience in systems engineering and program management. His systems engineering (hardware and software) background encompasses industrial (GenRad Corp, Wacker Siltronics, Westinghouse, Grumman and Rockwell Intern.), government R&D (DoD-China Lake) and university (Idaho State Univ, Portland State Univ, and Oregon State Univ) environments. John is currently the senior technology editor for Penton Media’s Wireless Systems Design (WSD) magazine. He is also the executive editor for the WSD Update e-Newsletter.

Mr. Blyler has co-authored an IEEE Press (1998) book on computer systems engineering entitled: ""What's Size Got To Do With It: Understanding Computer Systems."" Until just recently, he wrote a regular column for the IEEE I&M magazine. John continues to develop and teach web-based, graduate-level systems engineering courses on a part-time basis for Portland State University.

John holds a BS in Engineering Physics from Oregon State University (1982) and an MS in Electronic Engineering from California State University, Northridge (1991).

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