BGA Breakouts & Routing

July 14, 2008
By Charles Pfeil

Call it a “vanity” publishing project if you will, but Charles Pfeil’s book, BGA Breakouts & Routing, published by his employer, Mentor Graphics, is more than worth the price of admission. Pfeil, who is the engineering director of Mentor’s System Design Division, is an acknowledged industry expert in the black art of printed-circuit board (PCB) routing, and he brings his expertise to bear on this densely-packed and richly-illustrated volume.

The book explores the impact of dense ball-grid-array (BGA) packages with high pin counts on PCB designs and digs deeply into how to solve the problems these packages can spawn. Yes, Pfeil is a Mentor guy, and yes, the book’s illustrations are all screen captures from Mentor’s Expedition PCB design suite, of which Pfeil himself was the original architect. But don’t let that lead you to believe the book is a pitch for Mentor’s tools—it’s not that at all.

Rather, the book explores all of the issues related to PCB design involving dense BGA packages and offers practical information and advice in a clear, straightforward manner. The book’s copious, colorful illustrations guide the reader. It should serve as a valuable industry resource for designers struggling with PCB designs.

To obtain a copy of BGA Breakouts & Routing, visit Mentor’s Web site or contact the author directly at: [email protected]. Mentor Graphics
www.mentor.com/go/bga

About the Author

David Maliniak | MWRF Executive Editor

In his long career in the B2B electronics-industry media, David Maliniak has held editorial roles as both generalist and specialist. As Components Editor and, later, as Editor in Chief of EE Product News, David gained breadth of experience in covering the industry at large. In serving as EDA/Test and Measurement Technology Editor at Electronic Design, he developed deep insight into those complex areas of technology. Most recently, David worked in technical marketing communications at Teledyne LeCroy. David earned a B.A. in journalism at New York University.

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