Saelig offers 6½-digit benchtop multimeter

April 27, 2017

2 min read

Fairport, NY. Saelig Co. Inc. announced it is now offering the Siglent SDM3065X economical 6½-digit dual-display digital multimeter that is suited to high-precision, multifunction, and automation measurement applications. It combines basic high-accuracy measurement functions with multiple math and display choices, and it offers special features including histogram, trend-chart, bar-chart, statistics, hold-measurement, and dBm functions.

The SDM3065X multimeter’s front panel features a 4.3″ (480 x 272) high-resolution color

TFT-LCD that clearly shows the 2,200,000-count readings. This DMM’s clear keyboard layout and operation make it easy and quick to use, especially with its built-in help system. The many interfaces for remote storage and communication include USB device, USB host, and LAN. The Ethernet connection interface supports the common SCPI command set. It includes built-in cold terminal compensation for thermocouple temperature measurements.

Reading at up to 300 samples/second, the SDM3065X DMM takes measurements of true-RMS AC voltage and AC current, resistance to 100 MΩ, and capacitance to 10,000 mF, It also performs continuity and diode tests plus frequency and period measurements. It measures temperature, with support for thermocouple and RTD sensors. It contains 1 GB of flash memory for storage of configuration and data files, and it also supports USB external storage. Siglent’s EasySDM software, provided free, allows for easy PC connectivity, external control, and display. Housed in an compact (11.6″ × 10.3″ × 4.3″) prop-stand case, the SDM3065X weighs 7.5 lbs.

Applications include research and development, education, circuit testing and debug, and automated production testing. The SDM3065X is available now at $729.

Saelig also announced that is offering two new 25-GHz models in the Pico Technology PicoScope 9300 family of sampling oscilloscopes.

About the Author

Rick Nelson

Contributing Editor

Rick Nelson is a technical journalist who has served as executive editor of Test & Measurement World, chief editor of EDN, and executive editor of EE-Evaluation Engineering. He has also contributed to publications including Vision Systems Design and Electronic Design, and he has participated in many live panel discussions and webcasts. Rick has also held systems-engineering and product-development positions at General Electric and Litton Industries. He received his B.S.E.E. degree from The Pennsylvania State University.