Mtek

Marvin Test Solutions extends life of legacy semiconductor test systems

July 1, 2017

Irvine, CA. Marvin Test Solutions Inc. has announced the release of a new semiconductor test subsystem aimed at extending the life of legacy semiconductor testers. The MTEK (Marvin Test Expansion Kit) subsystem adds test capabilities to legacy semiconductor test systems that lack the ability to  meet the test requirements of current devices, the company said.

Based on MTS’ portfolio of PXI/PXIe chassis and instrumentation as well as selections from other industry-leading suppliers, MTEK allows customers to configure a subsystem with exactly the resources needed to deliver the capabilities lacking in their current legacy ATE. MTEK is a compact, easy-to-integrate, open architecture plug-and-play solution that cost-effectively adds RF, hi-performance digital, and/or hi-performance analog capabilities. MTEK is compatible with multiple legacy semiconductor test platforms from current and subsequently acquired companies including Teradyne, LTX/Credence (now part of Xcerra), Eagle (acquired by Teradyne), and Verigy (acquired by Advantest). Easily expandable in the field, MTEK is designed to support both engineering and production environments.

“Our customers were looking for a solution that would allow them to extend the life of their existing test systems without the associated capital investment of complete replacement,” said Stephen T. Sargeant, CEO of Marvin Test Solutions. “MTEK provides an upgrade path with the additional test capabilities they need as their requirements change.”

MTEK and other MTS semiconductor test solutions will be showcased at SEMICON West July 11-13 in San Francisco. Attending the event will be CEO Stephen T. Sargeant and director of North American sales Jim Fraine. To arrange a meeting and/or demonstration, email [email protected].

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RN (editor)

This post was selected and edited by Executive Editor Rick Nelson from a press release or other news source. Send relevant news to [email protected].

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