Test/Debugging System Arrives For µBGA Devices

Oct. 1, 1998
With the Signal Access Tool Kit (SAT), designers can debug and develop products that use micro ball-grid-array (µBGA) chip-scale packages. The kit gives users convenient access to signals for doing debugging and functional validation work during

With the Signal Access Tool Kit (SAT), designers can debug and develop products that use micro ball-grid-array (µBGA) chip-scale packages. The kit gives users convenient access to signals for doing debugging and functional validation work during the design and prototype stages of product development.The SAT resolves a fundamental concern regarding µBGA prototype testing: namely, how to gain access to individual signals on the pc board and the µBGA package itself. The kit is said to make migration to µBGA packages smoother. It allows test-point access to all µBGA package I/O signals by routing the test points around the package's perimeter, while maintaining most required keep-out zones of the pc board. The SAT is footprint-compatible with the µBGA package and fits directly on a board's land-pad sites, eliminating board redesign. Each SAT package contains three SAT units; pricing is $595 per unit.

Company: AGILENT TECHNOLOGIES INC

Product URL: Click here for more information

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