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Ensure Reliability in LEO Missions with Rad-Tolerant Plastic ICs (Download)

Dec. 13, 2022

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The demands of operating in a space environment bring unique challenges and unforgiving reliability requirements. Outside the protective cover of the Earth’s atmosphere, the solar system is filled with radiation. Space radiation can damage electronic devices, with potential effects ranging from performance degradation to a complete functional failure.

Due to the lower cost of low-Earth-orbit (LEO) launches, the space industry is now experiencing a rush to deploy small satellite constellations. These lightweight devices—up to a few hundred kilograms—typically operate at altitudes from 400 to 2,000 kilometers. They’re designed for objectives such as internet access and Earth observation missions. In the end, LEO apps will result in more products under development that were previously financially unfeasible to bring to market.

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