The OSE 450 set transmits digital signals from a disturbed device under test. Four sensors detect digital signals inside the DUT and convert them into optical signals, which are...
The P1 set is a pocket-sized Mini Burst Field Generator for development-stage troubleshooting of PCB assemblies. It generates Burst or ESD disturbance fields and helps identify...
The E1 set supports development-stage immunity testing of PCB assemblies against EFT/Burst disturbances. It injects defined disturbance currents into selected electronic areas...
The Langer IC Test System evaluates the emission and immunity behavior of integrated circuits during operation. It combines a defined test environment with method-specific probe...
Langer near-field probes enable precise measurement of electric and magnetic fields directly on PCBs and electronic assemblies. They help developers identify emission sources ...
