The sensor says “you’re close enough” when that’s what you need to know.

Probe orientation and shielding can separate real buck-regulator output-voltage ripple from radiated switching noise.

Microcontrollers can coordinate high-speed RF front ends to bring MHz-range measurement, automation, and signal processing into embedded workflows.

This article explains the principles and applications of continuous-time sigma-delta ADCs, while comparing their advantages and disadvantages with discrete-time versions.

Testing a power supply at different load currents and different input voltages is important, but it only shows part of the truth. A Bode plot can reveal the rest.

Carlo Manfredini from Emona Instruments demonstrates how the Controls Explorer Board (CONTEx) brings complex mathematical concepts to life on NI's learning platform.

Ring-oscillator process monitors give production test teams a fast on-die frequency measurement for identifying CMOS process variation and sorting dies at wafer level.

Measuring the current ripple of aluminum electrolytic capacitors is one of the keys to robust, reliable, and long-lasting power-supply designs.