EDA

Some simple tweaks to the order in which test patterns are created and applied can help control production test cost. But how do you determine the ideal order to create multiple pattern types and apply scan patterns on the tester?

Combining these Apps with an emulation environment makes it possible to increase fault coverage, increase production yield, and reduce ATE test time and cost.

Mentor's Capital Systems Network speeds development of controller-area-network (CAN) systems based on the SAE J1939 standard.

Speed, throughput, and latency are the key parameters in determining hardware-emulation performance.