Carlo Manfredini from Emona Instruments demonstrates how the Controls Explorer Board (CONTEx) brings complex mathematical concepts to life on NI's learning platform.
Ring-oscillator process monitors give production test teams a fast on-die frequency measurement for identifying CMOS process variation and sorting dies at wafer level.
The evacuated miniature crystal oscillator from Microchip is designed for applications that demand high stability, accuracy, and long-term reliability.
Danisense's latest high-precision DC and AC current clamp-on handles galvanically isolated measurements up to 500 A with a current measurement accuracy of ±0.1%.
By enhancing accuracy while reducing system complexity, the latest radar technology could play a key role in making advanced vehicle automation safer and more practical.